Introduction: X-ray is the most important and applicable tool in medicine, which is utilized in radiography and radiotherapy. Considering the difficulties exist in measuring x-ray profile there have been tremendous efforts to determine the profile by employing computational methods. FLUKA code is one of the multi purpose Monte Carlo codes, which can be used to simulate x-ray tubes. In the previous papers, MCNP results have been benchmarked with experimental data. In this work, the result obtained from Fluka code is compared to the data from MCNP code. Materials and Methods: MCNP 4C and Fluka 2006 codes have been employed to simulate x-ray profile. For the simulation of x-ray profile MCNP 4C and FLUKA2006codes were employed. The Geometry of the tubes has been implesmented accurately in the simulation. The angle of electrons' departure for electrons from the cathode is exactly considered in order to get 1.2mm focal spot. The anode is made from Tungsten with an angle of 12 degree. The thickness of the aluminum filter is 1.2 mm. Results: The result of x-ray profile from FLUKA and MCNP codes are determined prior to and after the filter. In order to survey the filter effects, the ratio of the profile before the filter to the one after the filter for both codes in 120 ke V is calculated. Discussion and Conclusion: The result obtained from MCNP and FLUKA codes are comparable in the range of bremsstrahlung spectra, but there are some differences between the results of FLUKA and MCNP codes especially in specific x-ray peaks, The most important feature to be used to evaluate the quality of x-ray tubes profiles and the filter effects are the bremsstrahlung x-ray profile. Therefore, both FLUKA and MCNP codes are fairly good in simulatingx-ray tubes profiles.

X-ray fluorescence (XRF) analysis is a reliable and non-destructive multi-element analysis method that is widely used in research and industrial applications. In this article, the advantages and limitations of handheld XRF analysis were discussed. Handheld XRF is portable, requires minimal sample preparation, and responds quickly. For alloy identification, one of the most common applications of XRF is often grade determination, which can be done in less than 40 seconds using handheld XRF. Handheld XRF is capable of quantifying more than 90% of the common alloying elements of the periodic table, from magnesium and heavier, which is about 72 elements. Due to the potential risk of working with ionizing radiation, the analysis should be performed by trained people and following safety precautions.

In this research work a rather new method was used to detect trace elements of small quantities. For this, X-ray intensity enhancement effect and standard samples of BAS Company were employed. In the standard sample a small amount of Rubidium was present, which by adding some quantities of SrCo3 to the sample the XRF characteristic peaks of Rubidium were enhanced. This effect proved to be applicable for detecting trace elements.

X-ray diffraction measurements were performed on CoaPt1-a/Pd, Co/Pd, Co/Fe, and Co/W multilayer samples with different structures, such as CoaPt1-a alloy layer composition α, bilayer thickness, and number of bilayers. Multilayer samples were made by magnetron sputtering in a chamber with multi-parallel guns and a position controllable substrate. Co  Pt1-a/ alloy layers were deposited by cosputtering from Co and Pt targets mounted on guns tilted towards a common substrate. Compositions of Co and Pt in CoaPt1-a layer were varied by use of different sputtering power. The thicknesses of magnetic and non-magnetic layers in multilayered samples were also systematically changed to investigate the relationship between X-ray diffraction lines and crystalline structures of multilayered films. It was found that the position of the main diffraction peak from multilayered films was solely determined by the crystalline structures within bilayers rather than bilayer thickness. A model was introduced to calculate microstructural parameters such as the thickness of interfaces and compositions at interfaces.